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Data Mining and Diagnosing IC Fails by Leendert M. Huisman (Paperback, 2010)

About this product

About this product

Product Information

There are many techniques for analyzing IC fails, but they are scattered over the professional IC test and diagnosis literature, and in various statistics and data mining handbooks. Moreover, many data mining techniques that are standard in other data analysis environments, and that are appropriate for analyzing IC fails, have not yet been employed for that purpose. Data Mining and Diagnosing IC Fails addresses the problem of obtaining maximum information from (functional) integrated circuit fail data about the defects that caused the fails. It starts at the highest level from mere sort codes, and drills down via various data mining techniques to detailed logic diagnosis. The various approaches discussed in this book have a thorough theoretical underpinning, but are geared towards applications on real life fail data and state of the art ICs. This book brings together a large number of analysis techniques that are suitable for IC fail data, but that are not available elsewhere in a single place. Several of the techniques, in fact, have been presented only recently in technical conferences. The purpose of the book is to bring together in one place a large number of analysis, data mining and diagnosis techniques that have proven to be useful in analyzing IC fails. The descriptions of the techniques and analysis routines is sufficiently detailed that professional manufacturing engineers can implement them in their own work environment.

Product Identifiers

Publisher
Springer-Verlag New York Inc.
ISBN-13
9781441937674
eBay Product ID (ePID)
104026545

Product Key Features

Book Title
Data Mining and Diagnosing IC Fails
Author
Leendert M. Huisman
Format
Paperback
Language
English
Topic
Engineering & Technology, Physics
Publication Year
2010
Type
Textbook
Number of Pages
250 Pages

Dimensions

Item Height
235mm
Item Width
155mm
Volume
31
Item Weight
421g

Additional Product Features

Title_Author
Leendert M. Huisman
Series Title
Frontiers in Electronic Testing
Country/Region of Manufacture
United States

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