In Thermal and Power Management of Integrated Circuits, power and thermal management issues in integrated circuits during normal operating conditions and stress operating conditions are addressed. Thermal management in VLSI circuits is becoming an integral part of the design, test, and manufacturing. Proper thermal management is the key to achieve high performance, quality and reliability. Performance and reliability of integrated circuits are strong functions of the junction temperature. A small increase in junction temperature may result in significant reduction in the device lifetime. This book reviews the significance of the junction temperature as a reliability measure under nominal and burn-in conditions. The latest research in the area of electro-thermal modeling of integrated circuits will also be presented. Recent models and associated CAD tools are covered and various techniques at the circuit and system levels are reviewed. Subsequently, the authors provide an insight into the concept of thermal runaway and how it may best be avoided. A section on low temperature operation of integrated circuits concludes the book.
Product Identifiers
Publisher
Springer-Verlag New York Inc.
ISBN-13
9780387257624
eBay Product ID (ePID)
96260313
Product Key Features
Book Title
Thermal and Power Management of Integrated Circuits
Author
Manoj Sachdev, Arman Vassighi
Format
Hardcover
Language
English
Topic
Engineering & Technology
Publication Year
2006
Type
Textbook
Number of Pages
182 Pages
Dimensions
Item Height
235mm
Item Width
155mm
Item Weight
990g
Additional Product Features
Title_Author
Manoj Sachdev, Arman Vassighi
Series Title
Integrated Circuits and Systems
Country/Region of Manufacture
United States
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