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About this product
- PublisherSpringer-Verlag New York Inc.
- Date of Publication21/11/2012
- SubjectEnergy Technology & Electrical Engineering
- Place of PublicationNew York, NY
- Country of PublicationUnited States
- ImprintSpringer-Verlag New York Inc.
- Content Notebiography
- Weight1099 g
- Width170 mm
- Height244 mm
- Spine33 mm
- Edited byCharles S. Barrett,Deane K. Smith,G. J. McCarthy,John V. Gilfrich,Paul K. Predecki,R. Ryon,Ron Jenkins,Ting C. Huang
- Format DetailsTrade paperback (US)
- Edition StatementSoftcover reprint of the original 1st ed. 1992
- Table Of ContentsWhole Pattern Fitting, Rietveld Analysis, and Calculated Diffraction Patterns. Quantitative Phase Analysis by XRay Diffraction (XRD). Thin Film and Surface Characterization by XRD. Lattice Defects and XRay Topography. Texture Analysis by XRD. XRD Instrumentation, Techniques, and Reference Materials. Stress Determination by Diffraction Methods. XRD Profile Fitting, Crystallite Size and Strain Determination. XRD Applications: Detection Limits, Superconductors, Organics, Minerals. Mathematical Methods in XRay Spectrometry (XRS). Thin Film and Surface Characterization by XRS and XPS. Total Reflection XRS. XRS Techniques and Instrumentation. XRS Applications. XRay Imaging and Tomography. 161 articles. Index.
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