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Analog Signal Generation for Built-In-Self-Test of Mixed-Signal Integrated Circuits by Albert K. Lu, Gordon W. Roberts (Paperback, 2012)

Analog Signal Generation for Built-In-Self-Test (BIST) of Mixed-Signal Integrated Circuits is a concise introduction to a powerful new signal generation technique. The book begins with a brief introduction to the testing problem and a review of conventional signal generation techniques. The book then describes an oversampling-based oscillator capable of generating high-precision analog tones using a combination of digital logic and D/A conversion. These concepts are then extended to multi-tone testing schemes without introducing a severe hardware penalty. The concepts are extended further to encompass piece-wise linear waveforms such as square, triangular and sawtooth waves. Experimental results are presented to verify the ideas in each chapter and finally, conclusions are drawn. For those readers unfamiliar with delta-sigma modulation techniques, a brief introduction to this subject is also provided in an appendix. The book is ideal for test engineers, researchers and circuits designers with an interest in IC testing methods.

Subject Area
Electrical Engineering
Author
Albert K. Lu, Gordon w. Roberts
Publication Name
Analog Signal Generation for Built-In-Self-Test of Mixed-Signal Integrated Circuits
Format
Paperback
Language
English
Subject
Physics
Publication Year
2012
Type
Textbook
Number of Pages
122 Pages

Title_Author
Albert K. Lu, Gordon w. Roberts
Series Title
The Springer International Series in Engineering and Computer Science
Country/Region of Manufacture
United States

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