Beam Diagnostics in Superconducting Accelerating Cavities: The Extraction of Transverse Beam Position from Beam-Excited Higher Order Modes by Pei Zhang (Paperback, 2016)


OUR TOP PICK

$210.80

+ $7.50 postage
Quantity
2 available
Condition
Brand new
Sold by
roxy*books (272649)98.6% Positive Feedback
Delivery
Est. 14 Mar - 21 MarFrom United Kingdom
Returns
7 days money back
Buyer pays return postage