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About this product
- DescriptionThis thesis presents the first direct observations of the 3D-shape, size and electrical properties of nascale filaments, made possible by a new Scanning Probe Microscopy-based tomography technique referred to as scalpel SPM. Using this invative techlogy and nm-scale observations, the author achieves essential insights into the filament formation mechanisms, improves the understanding required for device optimization, and experimentally observes phemena that had previously been only theoretically proposed.
- Author BiographyUmberto Celano received a M.Sc. degree in Nanoelectronics from the University of Rome Sapienza , Italy and a Ph.D. degree in Physics from the KU Leuven, Belgium in 2011 and 2015 respectively. Currently, he is a researcher in the material and component analysis group of imec in Belgium. Umberto's research interests include nanometer scale issues in materials, emerging nanoelectronics and physical characterization. His goal is to explore methods and novel metrology techniques that enable the understanding of the physics in nanomaterials and nanoelectronics devices.
- Author(s)Umberto Celano
- PublisherSpringer International Publishing AG
- Date of Publication21/06/2016
- SubjectIndustrial Chemistry & Manufacturing
- Series TitleSpringer Theses
- Place of PublicationCham
- Country of PublicationSwitzerland
- ImprintSpringer International Publishing AG
- Content Note78 black & white illustrations, 18 colour illustrations, biography
- Weight467 g
- Width155 mm
- Height235 mm
- Spine13 mm
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