Nonvolatile Semiconductor Memory Technology: A Comprehensive Guide to Understanding and Using NVSM Devices by I.E.E.E.Press (Hardback, 1997)
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About this product
- DescriptionComplete dependence on semiconductor vendors' application tes and data sheets is w a thing of the past thanks to this all-in-one comparison text on nvolatile semiconductor memory (NVSM) techlogy. Working electronics engineers can w refer to this book to access the technical data and applications-focused perspective they need to make intelligent decisions regarding the selection, specification, procurement, and application of NVSM devices. The most comprehensive book in the field, NONVOLATILE SEMICONDUCTOR MEMORY TECHNOLOGY gathers expertly-written information scattered throughout device literature in a single, well-balanced volume. This book features an in-depth overview accompanied by applications-oriented chapters on device reliability and endurance, radiation tolerance, as well as device physics and design. It is an essential reference for electronics engineers. Sponsored by: IEEE Components, Packaging, and Manufacturing Techlogy Society, IEEE Solid-State Circuits Council/Society.
- Author BiographyAbout the Editors William D. Brown is a university professor and head of the Department of Electrical Engineering at the University of Arkansas. As a Member of the Technical Staff at Sandia Laboratories in Albuquerque, NM, from 1969-1977, Dr. Brown initiated Sandia s research and development effort on metal-nitride-oxide-silicon (MNOS) device technology. After joining the faculty at the University of Arkansas in 1977, his nonvolatile semiconductor memory research concentrated on the synthesis and characterization of plasma-enhanced chemical vapor deposited (PECVD) silicon nitride for application in MNOS and SNOS memory devices. Dr. Brown has served on IEEE NVM standards committees, and he is an organizer and participant in the IEEE International Nonvolatile Memory Technology Conference and its precursor conferences. Joe E. Brewer is a Senior Advisory Engineer at the Northrop Grumman Corporation Electronic Sensors and Systems Division located near Baltimore, MD. Throughout his 36-year engineering career, Dr. Brewer has been engaged in the development of state-of-the-art microelectronic technology. He has been both a developer and user of NVSM devices. He has had extensive experiences with MNOS block-oriented devices and storage systems, as well as a variety of SONOS devices. Dr. Brewer has also served on IEEE NVM standards committees, and he is an organizer and participant in the IEEE International Nonvolatile Memory Technology Conference and its precursor conferences.
- Date of Publication15/10/1997
- SubjectElectronics Engineering & Communications Engineering
- Series TitleIEEE Press Series on Microelectronic Systems
- Place of PublicationPiscataway NJ
- Country of PublicationUnited States
- ImprintIEEE Publications,U.S.
- Content NoteIllustrations
- Weight1274 g
- Width186 mm
- Height265 mm
- Spine39 mm
- Edited byJoe Brewer,William Donald Brown
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