Characterization of High TC Materials and Devices by Electron Microscopy by Cambridge University Press (Paperback, 2006)

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This is a clear and up-to-date account of the application of electron-based microscopies to the study of high-Tc superconductors. Written by leading experts, this compilation provides a comprehensive review of scanning electron microscopy, transmission electron microscopy and scanning transmission electron microscopy, together with details of each technique and its applications.
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