Fundamental Aspects of Ultrathin Dielectrics on SI-Based Devices: Proceedings of the NATO Advanced Research Workshop on Fundamental Aspects of Ultrathin Dielectrics on SI-Based Devices - Towards an Atomic Scale Understanding, St.Petersburg, Russia, August 4-8, 1997 by Kluwer Academic Publishers (Paperback, 1998)

Brand new: lowest price

AU $481.95

+ AU $12.95 postage
  • See details for delivery est.
  • Brand new condition
Sold byausreseller (132657)97.6% positive Feedback