High-resolution X-ray Scattering: From Thin Films to Lateral Nanostructures by Tilo Baumbach, Vaclav Holy, Ulrich Pietsch (Paperback, 2013)

Brand new: lowest price

AU $207.33

Free postage
  • Get it by Wed, 2 May - Fri, 1 Jun from Ohio, United States
  • Brand new condition
  • • Returns accepted - 30 days money back
3 Scans and Resolution in Angular and Reciprocal Space. - 4 Basic Principles. - 5 Kinematical Theory. - 6 Dynamical Theory. - 7 Semikinematical Theory. - 11 X-Ray Scattering by Rough Multilayers.