Scanning Electron Microscopy and X-ray Microanalysis by Linda C. Sawyer, Charles E. Lyman, D. C. Joy, Patrick Echlin, J.R. Michael, Eric Lifshin, Dale E. Newbury, Joseph I. Goldstein (Mixed media product, 2002)
This text provides students as well as practitioners with a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray microanalysis. The authors emphasize the practical aspects of the techniques described. Topics discussed include user-controlled functions of scanning electron microscopes and x-ray spectrometers and the use of x-rays for qualitative and quantitative analysis. Separate chapters cover SEM sample preparation methods for hard materials, polymers, and biological specimens. In addition techniques for the elimination of charging in n-conducting specimens are detailed.
This text is written by a team of authors associated with SEM and X-ray Microanalysis Courses presented as part of the Lehigh University Microscopy Summer School. Several of the authors have participated in this activity for more than 30 years.
Charles E. Lyman, D. C. Joy, Dale E. Newbury, Eric Lifshin, J.R. Michael, Joseph I. Goldstein, Linda C. Sawyer, Patrick Echlin