Statistical investigation into techlogy t only provides a better understanding of the intrinsic features of the techlogy (analysis), but also leads to an improved design of the techlogy (synthesis). Physical principles and mathematical procedures of medical imaging techlogies have been extensively studied during past decades. However, less work has been done on their statistical aspect. Filling this gap, this book provides a theoretical framework for statistical investigation into medical techlogies. Rather than offer detailed descriptions of statistics of basic imaging protocols of X-ray CT and MRI, the book presents a method to conduct similar statistical investigations into more complicated imaging protocols.
Tianhu Lei is an associate professor at the University of Pittsburgh. He has previously worked at the University of Maryland, the University of Pennsylvania, and the Children's Hospital of Philadelphia. He earned a Ph.D. in electric and system engineering from the University of Pennsylvania.
Taylor & Francis Ltd
Date of Publication
Clinical Medicine: Professional
Chapman & Hall/CRC Interdisciplinary Statistics Series