This work constitutes a detailed study of electrical and magnetic properties in nametric materials with a range of scales: atomic-sized naconstrictions, micro- and nawires and thin films. Firstly, a vel method of fabricating atomic-sized constrictions in metals is presented; it relies on measuring the conduction of the device while a focused-ion-beam etching process is in progress.
Springer-Verlag Berlin and Heidelberg GmbH & Co. KG
Date of Publication
Technology: General & Reference
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Country of Publication
Springer-Verlag Berlin and Heidelberg GmbH & Co. K