Transition-Metal Defects in Silicon: New Insights from Photoluminescence Studies of Highly Enriched 28si by Michael Steger (Paperback, 2013)

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This dissertation presents the results of ultra-high resolution photoluminescence studies of these centres in specially prepared, highly enriched 28-Si samples. These fingerprints have revealed that the detailed constituents of all of the centres previously studied had been identified incorrectly.
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