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Characterization of Crystal Growth Defects by X-Ray Methods by B.K. Tanner (Paperback, 2012)

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This book contains the proceedings of a NATO Advanced Study Institute entitled Characterization of Crystal Growth Defects by X-ray Methods' held in the University of Durham, England from 29th August to 10th September 1979. The current interest in electronic materials, in particular silicon, gallium aluminium arsenide, and quartz, and the recent availability of synchrotron radiation for X-ray diffraction studies made this Advanced Study Institute particularly timely. Two main themes ran through the course: 1. A survey of the various types of defect occurring in crystal growth, the mechanism of their different methods of generation and their influence on the properties of relativelY perfect crystals. 2. A detailed and advanced course on the observation and characterization of such defects by X-ray methods. The main emphasis was on X-ray topographic techniques but a substantial amount of time was spent on goniometric techniques such as double crystal diffractometry and gamma ray diffraction. The presentation of material in this book reflects these twin themes. Section A is concerned with defects, Section C with techniques and in linking them. Section B provides a concise account of the basic theory necessary for the interpretation of X-ray topographs and diffractometric data. Although the sequence follows roughly the order of presentation at the Advanced Study Institute certain major changes have been made in order to improve the pedagogy. In particular, the first two chapters provide a vital, and seldom articulated, case for the need for characterization for crystals used in device technologies.

Product Identifiers

Publisher
Springer-Verlag New York Inc.
ISBN-13
9781475711288
eBay Product ID (ePID)
208800460

Product Key Features

Author
B.K. Tanner
Publication Name
Characterization of Crystal Growth Defects by X-Ray Methods
Format
Paperback
Language
English
Subject
Physics
Publication Year
2012
Type
Textbook
Number of Pages
589 Pages

Dimensions

Item Height
254mm
Item Width
178mm
Volume
63
Item Weight
1156g

Additional Product Features

Title_Author
B.K. Tanner
Series Title
Nato Science Series B
Country/Region of Manufacture
United States

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Characterization of Crystal Growth Defects by X-Ray Methods by B.K. Tanner (Paperback, 2012)

About this product

Product Information

Product Identifiers

Product Key Features

Dimensions

Additional Product Features

Best Selling in Adult Learning & University

Eduqas GCSE (9-1) Religious Studies Route B: Catholic Christianity and Judaism by Deirdre Cleary, Andrew Barron, Joy White, Patrick Harrison (Paperback, 2017)

Polyvagal Exercises for Safety and Connection: 50 Client-Centered Practices by Deb Dana (Paperback, 2020)

Save on Adult Learning & University

Netter Atlas of Human Anatomy: Classic Regional Approach

Michael Nehls The Indoctrinated Brain (Hardback) (US IMPORT)

Bill Perkins Die With Zero (Paperback)

Havard's Nursing Guide to Drugs

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