Scanning Tunneling Microscopy and its Application presents a unified view of the rapidly growing field of STM,and its many derivatives. A thorough discussion of the various principles provides the background to tunneling phenomena and leads to the many novel scanning-probe techniques, such as AFM, MFM, BEEM, PSTM, etc. After having examined the available instrumentation and the methods for tip and surface preparations, the monograph provides detailed accounts of STM application to metal and semiconductor surfaces, adsorbates and surface chemistry, biology, and nanofabrication. It examines limitations of the present-day investigations and provides hints about possible further trends. This second edition includes important new developments in the field.
Product Identifiers
Publisher
Springer-Verlag Berlin and Heidelberg Gmbh & Co. Kg
ISBN-13
9783540657156
eBay Product ID (ePID)
94520347
Product Key Features
Subject Area
Mechanical Engineering
Author
Chunli Bai
Publication Name
Scanning Tunneling Microscopy and Its Application
Format
Hardcover
Language
English
Subject
Chemistry
Publication Year
2000
Type
Textbook
Number of Pages
370 Pages
Dimensions
Item Height
234mm
Item Width
156mm
Volume
32
Item Weight
1600g
Additional Product Features
Title_Author
Chunli Bai
Series Title
Springer Series in Surface Sciences
Country/Region of Manufacture
Germany
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