Structural, Syntactic, and Statistical Pattern Recognition: Joint IAPR International Workshop, SSPR & SPR 2010, Cesme, Izmir, Turkey, August 18-20, 2010. Proceedings by Edwin R. Hancock, Richard C Wilson, Ilkay Ulusoy, Terry Windeatt, Francisco Escolano (Paperback, 2010)
This volume in the Springer Lecture Notes in Computer Science (LNCS) series contains the papers presented at the S+SSPR 2010 Workshops, which was the seventh occasion that SPR and SSPR workshops have been held jointly. S+SSPR 2010 was organized by TC1 and TC2, Technical Committees of the International Association for Pattern Recognition(IAPR), andheld inCesme, Izmir, whichis a seaside resort on the Aegean coast of Turkey. The conference took place during August 18-20, 2010, only a few days before the 20th International Conference on Pattern Recognition (ICPR) which was held in Istanbul. The aim of the series of workshops is to create an international forum for the presentation of the latest results and exchange of ideas between researchers in the ?elds of statistical and structural pattern recognition. SPR 2010 and SSPR 2010 received a total of 99 paper submissions from many di?erent countries around the world, giving it a truly international perspective, as has been the case for previous S+SSPR workshops. This volume contains 70 accepted papers, 39 for oral and 31 for poster presentation. In addition to par- lel oral sessions for SPR and SSPR, there were two joint oral sessions of interest to both SPR and SSPR communities. Furthermore, to enhance the workshop experience, there were two joint panel sessions on Structural Learning and Clustering, in which short author presentations were followed by discussion. Another innovation this year was the ?lming of the proceedings by Videol- tures.
Product Identifiers
Publisher
Springer-Verlag Berlin and Heidelberg Gmbh & Co. Kg
ISBN-13
9783642149795
eBay Product ID (ePID)
106560239
Product Key Features
Author
Edwin R. Hancock, Richard C Wilson, Ilkay Ulusoy, Terry Windeatt, Francisco Escolano
Publication Name
Structural, Syntactic, and Statistical Pattern Recognition: Joint IAPR International Workshop, SSPR & SPR 2010, Cesme, Izmir, Turkey, August 18-20, 2010. Proceedings
Format
Paperback
Language
English
Subject
Computer Science
Publication Year
2010
Type
Textbook
Number of Pages
758 Pages
Dimensions
Volume
6218
Additional Product Features
Series Title
Image Processing, Computer Vision, Pattern Recognition, and Graphics
Editor
Ilkay Ulusoy, Francisco Escolano, Terry Windeatt, Edwin R. Hancock, Richard C Wilson