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About this product
Product Identifiers
PublisherLogos Verlag Berlin
ISBN-103832525181
ISBN-139783832525187
eBay Product ID (ePID)230129718
Product Key Features
Number of Pages97 Pages
LanguageEnglish
Publication NameNear Field Emission Scanning Electron Microscopy
Publication Year2010
SubjectGeneral, Physics / General, Chemistry / General
TypeTextbook
AuthorTaryl L. Kirk
Subject AreaTechnology & Engineering, Science
SeriesApplied Electron Microskopy-Angewandte Elektronenmikroskopie Ser.
FormatTrade Paperback
Dimensions
Item Weight4.5 oz.
Item Length8.3 in
Item Width5.7 in
Additional Product Features
Intended AudienceCollege Audience
