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Scanning Probe Microscopy: Atomic Scale Engineering by Forces and Currents: New

US $188.13
ApproximatelyAU $283.46
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Last updated on 16 Dec, 2023 09:13:04 AEDSTView all revisionsView all revisions

Item specifics

Condition
Brand new: A new, unread, unused book in perfect condition with no missing or damaged pages. See the ...
Book Title
Scanning Probe Microscopy: Atomic Scale Engineering by Forces and
Publication Date
2006-06-28
Pages
282
ISBN
9780387400907
Subject Area
Technology & Engineering, Science
Publication Name
Scanning Probe Microscopy : Atomic Scale Engineering by Forces and Currents
Publisher
Springer New York
Item Length
9.3 in
Subject
Nanoscience, Materials Science / General, Electron Microscopes & Microscopy, Nanotechnology & Mems
Publication Year
2006
Series
Nanoscience and Technology Ser.
Type
Textbook
Format
Hardcover
Language
English
Author
Adam S. Foster, Lev Kantorovich, Andrew J. Fisher, Werner A. Hofer
Item Weight
46.2 Oz
Item Width
6.1 in
Number of Pages
Xiv, 282 Pages

About this product

Product Information

Scanning Probe Microscopy is a comprehensive source of information for researchers, teachers, and graduate students about the rapidly expanding field of scanning probe theory. Writing in a tutorial style, the authors explain from scratch the theory behind today's simulation techniques and give examples of theoretical concepts through state-of-the-art simulations, including the means to compare these results with experimental data. The book provides the first comprehensive framework for electron transport theory with its various degrees of approximations, thus allowing extensive insight into the physics of scanning probes. Experimentalists will appreciate how the materials properties influence the instrument's operation, and theorists will understand how simulations can be directly compared to experimental data. Key Features Serves as a comprehensive source of information for researchers, teachers, and students about the theory underlying the rapidly expanding field of scanning probe microscopy Provides a framework for linking scanning probe theory and simulations with experimental data Written in the style of a textbook with step-by-step examples of how theoretical concepts are used to generate state-of-the-art simulations

Product Identifiers

Publisher
Springer New York
ISBN-10
0387400907
ISBN-13
9780387400907
eBay Product ID (ePID)
48248759

Product Key Features

Number of Pages
Xiv, 282 Pages
Language
English
Publication Name
Scanning Probe Microscopy : Atomic Scale Engineering by Forces and Currents
Publication Year
2006
Subject
Nanoscience, Materials Science / General, Electron Microscopes & Microscopy, Nanotechnology & Mems
Type
Textbook
Subject Area
Technology & Engineering, Science
Author
Adam S. Foster, Lev Kantorovich, Andrew J. Fisher, Werner A. Hofer
Series
Nanoscience and Technology Ser.
Format
Hardcover

Dimensions

Item Weight
46.2 Oz
Item Length
9.3 in
Item Width
6.1 in

Additional Product Features

Intended Audience
Scholarly & Professional
LCCN
2005-936713
Dewey Edition
22
Number of Volumes
1 Vol.
Illustrated
Yes
Dewey Decimal
502.8/2
Lc Classification Number
Ta418.5-.84
Table of Content
The Physics of Scanning Probe Microscopes.- SPM: The Instrument.- Theory of Forces.- Electron Transport Theory.- Transport in the Low Conductance Regime.- Bringing Theory to Experiment in SFM.- Topographic images.- Single-Molecule Chemistry.- Current and Force Spectroscopy.- Outlook.
Copyright Date
2006

Item description from the seller

AlibrisBooks

AlibrisBooks

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