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Lock-in Thermography : Basics and Use for Evaluating Electronic Devices and M...
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Located in: Jessup, Maryland, United States
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eBay item number:364863570955
Item specifics
- Condition
- ISBN
- 9783319998244
- Book Title
- Lock-In Thermography : Basics and Use for Evaluating Electronic Devices and Materials
- Book Series
- Springer Series in Advanced Microelectronics Ser.
- Item Length
- 9.3 in
- Publisher
- Springer International Publishing A&G
- Edition
- 3
- Publication Year
- 2019
- Format
- Hardcover
- Language
- English
- Illustrator
- Yes
- Genre
- Technology & Engineering, Science
- Topic
- Materials Science / General, Lasers & Photonics, Physics / Optics & Light, Electronics / Semiconductors, Remote Sensing & Geographic Information Systems, Electronics / General
- Item Width
- 6.1 in
- Item Weight
- 24.1 Oz
- Number of Pages
- Xxi, 321 Pages
About this product
Product Information
This book discusses lock-in thermography (LIT) as a dynamic variant of the widely known IR thermography. It focuses on applications to electronic devices and materials, but also includes chapters addressing non-destructive evaluation. Periodically modulating heat sources allows a much-improved signal-to-noise ratio (up to 1000x) and a far better lateral resolution compared to steady-state thermography. Reviewing various experimental approaches to LIT, particularly the commercial LIT systems available, this 3rd edition introduces new LIT applications, such as illuminated LIT applied to solar cells, non-thermal LIT lifetime mapping and LIT application to spin caloritronics problems. Numerous LIT investigation case studies are also included.
Product Identifiers
Publisher
Springer International Publishing A&G
ISBN-10
3319998242
ISBN-13
9783319998244
eBay Product ID (ePID)
5038415110
Product Key Features
Book Title
Lock-In Thermography : Basics and Use for Evaluating Electronic Devices and Materials
Edition
3
Format
Hardcover
Language
English
Topic
Materials Science / General, Lasers & Photonics, Physics / Optics & Light, Electronics / Semiconductors, Remote Sensing & Geographic Information Systems, Electronics / General
Book Series
Springer Series in Advanced Microelectronics Ser.
Publication Year
2019
Illustrator
Yes
Genre
Technology & Engineering, Science
Number of Pages
Xxi, 321 Pages
Dimensions
Item Length
9.3 in
Item Width
6.1 in
Item Weight
24.1 Oz
Additional Product Features
Series Volume Number
10
Number of Volumes
1 Vol.
Lc Classification Number
Qc685-689.55
Table of Content
Introduction.- Physical and Technical Basics.- Experimental Technique.- Theory.- Measurement Strategies.- Typical Applications.- Summary and Outlook.
Copyright Date
2018
Dewey Decimal
621.381548
Dewey Edition
22
Item description from the seller
Seller assumes all responsibility for this listing.
eBay item number:364863570955
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Item location:
Jessup, Maryland, United States
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t***d (20)- Feedback left by buyer.
Past month
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Item was delivered as advertised however it was not delivered in a box which allowed it to receive some minor damage. Book was in 2 very durable form fitted vinyl/plastic bags which would have been great had then been placed in a box to protect it. Seller was very easy to discuss issue with and the damage is slight. I would buy again from this seller.
u***_ (100)- Feedback left by buyer.
Past 6 months
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Hermoso libro..!!!!!.. Muy bien cuidado e impecable empaquetado para envío. Realmente vale cada dólar gastado en el. Manejo y envío muy profesional. Excelente vendedor. Lo recomiendo por la calidad de sus productos, los precios, la comunicación sobre el desarrollo de mi orden y el manejo y envio. Gran experiencia de compra con este vendedor.
f***g (1846)- Feedback left by buyer.
Past month
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Not standard size, used; priced like new standard size. Seller refused to pay return shipping for not-standard item, not noted in listing. I learned not to buy a book without a listed size; could be anything.
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