|Listed in category:
This listing sold on Thu, 15 May at 2:03 AM.
Authentic Louis Vuitton Small flap Dust Storage Bag 5 x 3.75” Cotton SLG wallet
Sold
Authentic Louis Vuitton Small flap Dust Storage Bag 5 x 3.75” Cotton SLG wallet
US $26.62US $26.62
Fri, 16 May, 02:03Fri, 16 May, 02:03
Have one to sell?

Authentic Louis Vuitton Small flap Dust Storage Bag 5 x 3.75” Cotton SLG wallet

US $26.62
ApproximatelyAU $40.80
or Best Offer
Condition:
New without box
    Postage:
    US $4.60 (approx. AU $7.05) USPS Ground Advantage®.
    Located in: Hugo, Minnesota, United States
    Delivery:
    Estimated between Wed, 13 Aug and Wed, 20 Aug to 94104
    Delivery time is estimated using our proprietary method which is based on the buyer's proximity to the item location, the postage service selected, the seller's postage history, and other factors. Delivery times may vary, especially during peak periods.
    Returns:
    No returns accepted.
    Payments:
         Diners Club

    Shop with confidence

    eBay Money Back Guarantee
    Get the item you ordered or your money back. Learn moreeBay Money Back Guarantee - opens new window or tab
    Seller assumes all responsibility for this listing.
    eBay item number:388383967510

    Item specifics

    Condition
    New without box: This item is brand new and has never been used, but doesn't have tags and/or is ...
    Brand
    Louis Vuitton
    Department
    Unisex
    Type
    Dust Cover
    Color
    Beige
    Theme
    Designer, Travel
    Style
    Fashionable
    Material
    Cotton
    Features
    Lightweight
    Fabric Type
    cotton
    Accents
    Logo

    Item description from the seller

    About this seller

    billionaireblossoms

    100% positive Feedback20 items sold

    Joined Mar 2025
    Usually responds within 24 hours

    Seller feedback (10)

    All ratings
    Positive
    Neutral
    Negative
      • o***o (168)- Feedback left by buyer.
        Past 6 months
        Verified purchase
        Fantastic seller! Super fast shipping!!
      See all feedback