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Scanning Probe Microscopy: Atomic Scale Engineering by Forces and Currents by Ad

grandeagleretail
  • (921686)
US $186.85
ApproximatelyAU $281.53
Condition:
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eBay item number:395157057835
Last updated on 19 May, 2024 16:54:47 AESTView all revisionsView all revisions

Item specifics

Condition
Brand new: A new, unread, unused book in perfect condition with no missing or damaged pages. See the ...
ISBN-13
9781441923066
Book Title
Scanning Probe Microscopy
ISBN
9781441923066
Subject Area
Technology & Engineering, Science
Publication Name
Scanning Probe Microscopy : Atomic Scale Engineering by Forces and Currents
Publisher
Springer New York
Item Length
9.3 in
Subject
Nanoscience, Materials Science / General, Electron Microscopes & Microscopy, Nanotechnology & Mems
Publication Year
2010
Series
Nanoscience and Technology Ser.
Type
Textbook
Format
Trade Paperback
Language
English
Author
Adam Foster, Werner A. Hofer
Item Weight
16.1 Oz
Item Width
6.1 in
Number of Pages
Xiv, 282 Pages

About this product

Product Information

Scanning Probe Microscopy provides a comprehensive source of information for researchers, teachers, and graduate students about the rapidly expanding field of scanning probe theory. Written in the style of a textbook, it explains from scratch the theory behind today's simulation techniques and gives examples of theoretical concepts through state-of-the-art simulations, including the means to compare these results with experimental data. The book provides the first comprehensive framework for electron transport theory with its various degrees of approximations used in today's research, thus allowing extensive insight into the physics of scanning probes. Experimentalists will appreciate how the instrument's operation is changed by materials properties; theorists will understand how simulations can be directly compared to experimental data.

Product Identifiers

Publisher
Springer New York
ISBN-10
1441923063
ISBN-13
9781441923066
eBay Product ID (ePID)
109176802

Product Key Features

Number of Pages
Xiv, 282 Pages
Language
English
Publication Name
Scanning Probe Microscopy : Atomic Scale Engineering by Forces and Currents
Publication Year
2010
Subject
Nanoscience, Materials Science / General, Electron Microscopes & Microscopy, Nanotechnology & Mems
Type
Textbook
Subject Area
Technology & Engineering, Science
Author
Adam Foster, Werner A. Hofer
Series
Nanoscience and Technology Ser.
Format
Trade Paperback

Dimensions

Item Weight
16.1 Oz
Item Length
9.3 in
Item Width
6.1 in

Additional Product Features

Intended Audience
Scholarly & Professional
Dewey Edition
22
Number of Volumes
1 Vol.
Illustrated
Yes
Dewey Decimal
502.82
Lc Classification Number
Ta418.5-.84
Table of Content
The Physics of Scanning Probe Microscopes.- SPM: The Instrument.- Theory of Forces.- Electron Transport Theory.- Transport in the Low Conductance Regime.- Bringing Theory to Experiment in SFM.- Topographic images.- Single-Molecule Chemistry.- Current and Force Spectroscopy.- Outlook.
Copyright Date
2006

Item description from the seller

grandeagleretail

grandeagleretail

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