The book is focused on measurement automation, specifically using the LabView tool. It explains basic measurements in a simplified manner with appropriate step-by-step explanations and discussions of instrument capabilities. It touches upon aspects of measurement science, microwave measurements and software development for measurement. The book can be used as a guide by technicians, researchers and scientists involved in metrology laboratories to automate measurements. The book explains the development process for automation of measurement systems for every step of the software development lifecycle. It covers system design and automation policy creation. The book uses a top-down approach which enables the reader to relate their own problems and develop a system with their own analysis. The book includes many examples, illustrations, flowcharts, measurement results and screenshots of a worked-out automation software for microwave measurement. The book includes discussions on microwave measurements-attenuation, microwave power and E-field strength. The contents of this book will be of interest to students, researchers and scientists working in the field of electromagnetism, antennas, communication and electromagnetic interference/electromagnetic compatibility (EMI/EMC).
Product Identifiers
Publisher
Springer Verlag, Singapore
ISBN-13
9789811062797
eBay Product ID (ePID)
25046475975
Product Key Features
Subject Area
Manufacturing Engineering
Author
P. S. Negi, V. N. Ojha, Satya Kesh Dubey, Naina Narang
Publication Name
Labview Based Automation Guide for Microwave Measurements
Format
Paperback
Language
English
Subject
Engineering & Technology, Physics
Publication Year
2017
Type
Textbook
Number of Pages
45 Pages
Dimensions
Item Height
235mm
Item Width
155mm
Item Weight
1175g
Additional Product Features
Title_Author
V. N. Ojha, Naina Narang, Satya Kesh Dubey, P. S. Negi