Efficient Test Methodologies for High-Speed Serial Links describes in detail several new and promising techniques for cost-effectively testing high-speed interfaces with a high test coverage. One primary focus of Efficient Test Methodologies for High-Speed Serial Links is on efficient testing methods for jitter and bit-error-rate (BER), which are widely used for quantifying the quality of a communication system. Various analysis as well as experimental results are presented to demonstrate the validity of the presented techniques.
Product Identifiers
Publisher
Springer
ISBN-13
9789048134427
eBay Product ID (ePID)
105269738
Product Key Features
Book Title
Efficient Test Methodologies for High-Speed Serial Links