Picture 1 of 1

Stock photo

Applied Scanning Probe Methods V: Scanning Probe Microscopy Techniques by Bharat - Picture 1 of 1

Applied Scanning Probe Methods V: Scanning Probe Microscopy Techniques by Bharat Bhushan, Harald Fuchs, Satoshi Kawata (Hardcover, 2006)

thenilestore (1241488)

99% positive feedback

Price:

AU $271.63

+ $4.99 postage

Estimated delivery Wed, 11 Jun - Tue, 17 Jun

Returns:

30-day returns. Buyer pays for return postage. If you use an eBay postage label, it will be deducted from your refund amount.

Condition:

Brand new

Take AU $10.00 off this item

See details

By Bharat Bhushan, Harald Fuchs, Satoshi Kawata. Integrated Cantilevers and Atomic Force Microscopes. - Electrostatic Microscanner. - High-Frequency Dynamic Force Microscopy. - Torsional Resonance Microscopy and Its Applications.

About this product

Product Information

The volumes V, VI and VII will examine the physical and technical foundation for recent progress in applied scanning probe techniques. These volumes constitute a timely comprehensive overview of SPM applications. This is the first book summarizing the state-of-the-art of this technique. The chapters are written by leading researchers and application scientists from all over the world and from various industries to provide a broader perspective.