Product Information
Are memory applications more critical than they have been in the past? Yes, but even more critical is the number of designs and the sheer number of bits on each design. It is assured that catastrophes, which were avoided in the past because memories were small, will easily occur if the design and test engineers do not do their jobs very carefully. High Performance Memory Testing: Design Principles, Fault Modeling and Self Test is based on the author's 20 years of experience in memory design, memory reliability development and memory self test. High Performance Memory Testing: Design Principles, Fault Modeling and Self Test is written for the professional and the researcher to help them understand the memories that are being tested.Product Identifiers
PublisherSpringer-Verlag New York Inc.
ISBN-139781402072550
eBay Product ID (ePID)94754947
Product Key Features
Subject AreaElectrical Engineering
Publication NameHigh Performance Memory Testing: Design Principles, Fault Modeling and Self-Test
SubjectComputer Science, Physics
Publication Year2002
TypeTextbook
FormatHardcover
LanguageEnglish
AuthorR. Dean Adams
Dimensions
Item Height235 mm
Item Weight1220 g
Item Width155 mm
Volume22A
Additional Product Features
Country/Region of ManufactureUnited States
Title_AuthorR. Dean Adams
Series TitleFrontiers in Electronic Testing