High Performance Memory Testing: Design Principles, Fault Modeling and Self-Test by R. Dean Adams (Hardcover, 2002)

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The relentless press of Moore's law drives more and more bits onto a single chip. These subtle fails must be caught or else quality will suffer severely. Yes, but even more critical is the number of designs and the sheer number of bits on each design.

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Product Information

Are memory applications more critical than they have been in the past? Yes, but even more critical is the number of designs and the sheer number of bits on each design. It is assured that catastrophes, which were avoided in the past because memories were small, will easily occur if the design and test engineers do not do their jobs very carefully. High Performance Memory Testing: Design Principles, Fault Modeling and Self Test is based on the author's 20 years of experience in memory design, memory reliability development and memory self test. High Performance Memory Testing: Design Principles, Fault Modeling and Self Test is written for the professional and the researcher to help them understand the memories that are being tested.

Product Identifiers

PublisherSpringer-Verlag New York Inc.
ISBN-139781402072550
eBay Product ID (ePID)94754947

Product Key Features

Subject AreaElectrical Engineering
Publication NameHigh Performance Memory Testing: Design Principles, Fault Modeling and Self-Test
SubjectComputer Science, Physics
Publication Year2002
TypeTextbook
FormatHardcover
LanguageEnglish
AuthorR. Dean Adams
Number of Pages250 Pages

Dimensions

Item Height235 mm
Item Weight1220 g
Item Width155 mm
Volume22A

Additional Product Features

Country/Region of ManufactureUnited States
Title_AuthorR. Dean Adams
Series TitleFrontiers in Electronic Testing
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