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Frontiers in Electronic Testing Ser.: High Performance Memory Testing : Design Principles, Fault Modeling and Self-Test by R. Dean Adams (2002, Hardcover)
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The relentless press of Moore's law drives more and more bits onto a single chip. These subtle fails must be caught or else quality will suffer severely. Yes, but even more critical is the number of designs and the sheer number of bits on each design.
- Buy It NowHigh Performance Memory Testing: Design Principles, Fault Modeling and Self-Test
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About this product
Product Identifiers
PublisherSpringer
ISBN-101402072554
ISBN-139781402072550
eBay Product ID (ePID)94754947
Product Key Features
Number of PagesXiv, 250 Pages
LanguageEnglish
Publication NameHigh Performance Memory Testing : Design Principles, Fault Modeling and Self-Test
Publication Year2002
SubjectHardware / General, Cad-Cam, Electronics / Circuits / General, Electrical
TypeTextbook
Subject AreaComputers, Technology & Engineering
AuthorR. Dean Adams
SeriesFrontiers in Electronic Testing Ser.
FormatHardcover
Dimensions
Item Weight43 Oz
Item Length9.3 in
Item Width6.1 in
Additional Product Features
Intended AudienceScholarly & Professional
