Security problems have evolved in the corporate world because of techlogical changes, such as using the Internet as a means of communication. With this, the creation, transmission, and storage of information may represent security problem. Metrics and Methods for Security Risk Management is of interest, especially since the 9/11 terror attacks, because it addresses the ways to manage risk security in the corporate world. The book aims to provide information about the fundamentals of security risks and the corresponding components, an analytical approach to risk assessments and mitigation, and quantitative methods to assess the risk components. In addition, it also discusses the physical models, principles, and quantitative methods needed to assess the risk components. The by-products of the methodology used include security standards, audits, risk metrics, and program frameworks. Security professionals, as well as scientists and engineers who are working on technical issues related to security problems will find this book relevant and useful.
Carl S. Young is a recognized subject matter expert in information and physical security risk management. He is currently a Managing Director and the Chief Security Officer at Stroz Friedberg, an international security risk consulting firm. He is the former Global Head of Physical Security Technology at Goldman Sachs as well as a former Senior Executive and Supervisory Special Agent at the FBI. He was also a consultant to the JASON Defense Advisory Group. Mr. Young is the author of Metrics and Methods for Security Risk Management (Syngress, 2010), and The Science and Technology of Counterterrorism (Butterworth-Heinemann, 2014) as well as numerous journal publications. In 1997 he was awarded the President's Foreign Intelligence Advisory Board (PFIAB) James R. Killian Award by the White House for significant individual contributions to U.S. national security. Mr. Young received undergraduate and graduate degrees in mathematics and physics from the Massachusetts Institute of Technology.