Advances in Imaging & Electron Physics merges two long-running serials--Advances in Electronics & Electron Physics and Advances in Optical & Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
Product Identifiers
Publisher
Elsevier Science Publishing Co Inc
ISBN-13
9780120147502
eBay Product ID (ePID)
96225015
Product Key Features
Author
Not Available
Publication Name
Modern Map Methods in Particle Beam Physics: Volume 108