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Statistical Performance Analysis and Modeling Techniques for Nanometer VLSI Designs by Hao Yu, Sheldon X.-D. Tan, Ruijing Shen (Paperback, 2014)

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Since process variation and chip performance uncertainties have become more pronounced as technologies scale down into the nanometer regime, accurate and efficient modeling or characterization of variations from the device to the architecture level have become imperative for the successful design of VLSI chips. This book provides readers with tools for variation-aware design methodologies and computer-aided design (CAD) of VLSI systems, in the presence of process variations at the nanometer scale. It presents the latest developments for modeling and analysis, with a focus on statistical interconnect modeling, statistical parasitic extractions, statistical full-chip leakage and dynamic power analysis considering spatial correlations, statistical analysis and modeling for large global interconnects and analog/mixed-signal circuits. Provides readers with timely, systematic and comprehensive treatments of statistical modeling and analysis of VLSI systems with a focus on interconnects, on-chip power grids and clock networks, and analog/mixed-signal circuits; Helps chip designers understand the potential and limitations of their design tools, improving their design productivity; Presents analysis of each algorithm with practical applications in the context of real circuit design; Includes numerical examples for the quantitative analysis and evaluation of algorithms presented. Provides readers with timely, systematic and comprehensive treatments of statistical modeling and analysis of VLSI systems with a focus on interconnects, on-chip power grids and clock networks, and analog/mixed-signal circuits; Helps chip designers understand the potential and limitations of their design tools, improving their design productivity; Presents analysis of each algorithm with practical applications in the context of real circuit design; Includes numerical examples for the quantitative analysis and evaluation of algorithms presented.

Product Identifiers

Publisher
Springer-Verlag New York Inc.
ISBN-13
9781489987877
eBay Product ID (ePID)
209276639

Product Key Features

Author
Hao Yu, Sheldon X.-D. Tan, Ruijing Shen
Publication Name
Statistical Performance Analysis and Modeling Techniques for Nanometer Vlsi Designs
Format
Paperback
Language
English
Subject
Engineering & Technology, Computer Science, Physics
Publication Year
2014
Type
Textbook
Number of Pages
306 Pages

Dimensions

Item Height
235mm
Item Width
155mm
Item Weight
516g

Additional Product Features

Title_Author
Hao Yu, Ruijing Shen, Sheldon X.-D. Tan
Country/Region of Manufacture
United States

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Statistical Performance Analysis and Modeling Techniques for Nanometer VLSI Designs by Hao Yu, Sheldon X.-D. Tan, Ruijing Shen (Paperback, 2014)

About this product

Product Information

Product Identifiers

Product Key Features

Dimensions

Additional Product Features

Best Selling in Adult Learning & University

Eduqas GCSE (9-1) Religious Studies Route B: Catholic Christianity and Judaism by Deirdre Cleary, Andrew Barron, Joy White, Patrick Harrison (Paperback, 2017)

Polyvagal Exercises for Safety and Connection: 50 Client-Centered Practices by Deb Dana (Paperback, 2020)

Save on Adult Learning & University

Netter Atlas of Human Anatomy: Classic Regional Approach

Michael Nehls The Indoctrinated Brain (Hardback) (US IMPORT)

Bill Perkins Die With Zero (Paperback)

Havard's Nursing Guide to Drugs

The Fourth Turning By Neil Howe, William Strauss

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